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Pulsed measurement method for characterizing chemical solutions using nanowire field effect transistors
- Source :
- 2010 International Conference on Microelectronic Test Structures (ICMTS).
- Publication Year :
- 2010
- Publisher :
- IEEE, 2010.
-
Abstract
- This paper presents a method for characterizing chemical solutions using nanowire field effect transistors. A pulsed gate potential method is used to prevent instabilities related to the dynamics of ions and other charged species present in the solution. Applying this method realizes a significant increase of the stability of the drain current versus gate potential characteristics of the devices, enabling reproducible characterization of chemical solutions with nanowire field effect transistors in aqueous environments.
- Subjects :
- Materials science
Silicon
business.industry
Nanowire
chemistry.chemical_element
Nanotechnology
Potential method
Hardware_PERFORMANCEANDRELIABILITY
Condensed Matter::Mesoscopic Systems and Quantum Hall Effect
Characterization (materials science)
Computer Science::Hardware Architecture
Computer Science::Emerging Technologies
chemistry
Logic gate
Hardware_INTEGRATEDCIRCUITS
Optoelectronics
Fluidics
Field-effect transistor
Electric potential
business
Hardware_LOGICDESIGN
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 2010 International Conference on Microelectronic Test Structures (ICMTS)
- Accession number :
- edsair.doi...........aac4a02a966653205da8750d67c7ed15