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Calculation of the Auger lifetime in degenerate n-type (Hg,Cd)Te

Authors :
T. N. Casselman
Source :
Physics of Narrow Gap Semiconductors ISBN: 9783540111917
Publication Year :
2008
Publisher :
Springer Berlin Heidelberg, 2008.

Abstract

The lifetime, TAl due to the,two-band, Auger 1 recombination mechanism is calculated for degenerate n-type (Hg,Cd)Te as a function of equilibrium carrier concentration, no under low modulation. For no sufficiently large so that the Fermi energy, EF is at least a kBT above the conduction band minimum, τAl ∝ 1/no/γ where γ < 1. For x = 0.2 and 50K ≤ T ≤ 200K, 0.7 ≤ γ ≤ 0.8. For EF(no) at least 3 kBT below the conduction band minimum, τAl ∝ 1/no/2.It is also found that in the degenerate region, τAl decreases with T for fixed no.

Details

ISBN :
978-3-540-11191-7
ISBNs :
9783540111917
Database :
OpenAIRE
Journal :
Physics of Narrow Gap Semiconductors ISBN: 9783540111917
Accession number :
edsair.doi...........aab637564d9ae15a1f179d550e091e84