A novel gate-suppression technique for ESD protection

A novel gate-suppression technique derived from source-pumping technique is proposed for Electrostatic Discharge (ESD) protection application. By employing the complementary SCR structure, an improved source-pumping and the gate-suppression scheme are able to extend ESD window and endure a high level of ESD impact without additional layout area cost. The fast rise time TLP test revealed the gate-suppression technique provide more effective protection than the source-pumping technique.