Cite
A new connected device-based Failure Mode and Effects Analysis model
MLA
Chen Xuan, et al. “A New Connected Device-Based Failure Mode and Effects Analysis Model.” Proceedings of 2014 IEEE International Conference on Service Operations and Logistics, and Informatics, Oct. 2014. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........aa7c053cc276546f3349bb21a9a0292f&authtype=sso&custid=ns315887.
APA
Chen Xuan, Jinfeng Li, Bing Shao, Changrui Ren, & Hao Ji. (2014). A new connected device-based Failure Mode and Effects Analysis model. Proceedings of 2014 IEEE International Conference on Service Operations and Logistics, and Informatics.
Chicago
Chen Xuan, Jinfeng Li, Bing Shao, Changrui Ren, and Hao Ji. 2014. “A New Connected Device-Based Failure Mode and Effects Analysis Model.” Proceedings of 2014 IEEE International Conference on Service Operations and Logistics, and Informatics, October. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........aa7c053cc276546f3349bb21a9a0292f&authtype=sso&custid=ns315887.