Back to Search
Start Over
Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐Bias‐Stress and Negative‐Bias‐Illumination‐Stress Instabilities in Self‐Aligned Top‐Gate Coplanar In–Ga–Zn–O Thin‐Film Transistors
- Source :
- Advanced Electronic Materials. 8:2101062
- Publication Year :
- 2022
- Publisher :
- Wiley, 2022.
- Subjects :
- Electronic, Optical and Magnetic Materials
Subjects
Details
- ISSN :
- 2199160X
- Volume :
- 8
- Database :
- OpenAIRE
- Journal :
- Advanced Electronic Materials
- Accession number :
- edsair.doi...........aa53adc84c196b39b011273b56a23cfa
- Full Text :
- https://doi.org/10.1002/aelm.202101062