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Measurement of thermoelectric characteristics of high resistance nano films

Authors :
蔡浩原 Cai Hao-yuan
陈兴 Chen Xing
张璐璐 Zhang Lu-lu
李亚亭 Li Ya-ting
崔大付 Cui Da-fu
Source :
Optics and Precision Engineering. 22:1794-1799
Publication Year :
2014
Publisher :
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 2014.

Subjects

Subjects :
High resistance
Materials science
business.industry
Seebeck coefficient
Nano
Thermoelectric effect
Electronic engineering
Optoelectronics
business
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials

Details

ISSN :
1004924X
Volume :
22
Database :
OpenAIRE
Journal :
Optics and Precision Engineering
Accession number :
edsair.doi...........a9eb8d08f6e95e5811dfade6d5b74659

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