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Improved Z-axis Resolution in Serial Block Face SEM with Dual Primary Energies and Monte Carlo Simulation of Electron Scattering
- Source :
- Microscopy and Microanalysis. 24:1440-1441
- Publication Year :
- 2018
- Publisher :
- Oxford University Press (OUP), 2018.
- Subjects :
- 010302 applied physics
Materials science
Monte Carlo method
Resolution (electron density)
02 engineering and technology
021001 nanoscience & nanotechnology
01 natural sciences
Computational physics
Dual (category theory)
law.invention
law
0103 physical sciences
Block face
Cartesian coordinate system
0210 nano-technology
Instrumentation
Electron scattering
Subjects
Details
- ISSN :
- 14358115 and 14319276
- Volume :
- 24
- Database :
- OpenAIRE
- Journal :
- Microscopy and Microanalysis
- Accession number :
- edsair.doi...........a9da4edc9e90bc929c418a5925393584