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The resistive-heating characterization of laser heating system and LaB6 characterization of X-ray diffraction of beamline 12.2.2 at advanced light source
- Source :
- Journal of Physics and Chemistry of Solids. 71:1179-1182
- Publication Year :
- 2010
- Publisher :
- Elsevier BV, 2010.
-
Abstract
- X-ray diffraction from LaB 6 standards document a precision of 478 ppm in lattice-parameter determinations for beamline 12.2.2 at Lawrence Berkeley National Laboratory′s Advanced Light Source, a facility for characterizing materials at high pressures and temperatures using laser- and resistance-heated diamond cells. Melting of Ni, Mo, Pt and W, resistively heated at 1 atm pressure in Ar, provides a validation of the beamline spectroradiometric system that is used to determine sample temperatures. The known melting temperatures, which range from 1665 to 3860 K for these metals, are all reproduced to within ±80 K.
- Subjects :
- Diffraction
Materials science
business.industry
Analytical chemistry
Diamond
General Chemistry
engineering.material
Condensed Matter Physics
Laser
law.invention
Characterization (materials science)
Optics
Light source
Beamline
law
X-ray crystallography
engineering
General Materials Science
business
Joule heating
Subjects
Details
- ISSN :
- 00223697
- Volume :
- 71
- Database :
- OpenAIRE
- Journal :
- Journal of Physics and Chemistry of Solids
- Accession number :
- edsair.doi...........a96d68ea47dd979aaad6b76920ad675c