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Rapid Compositional EELS and EDS Mapping of Amorphous Silicate Matrix in Extraterrestrial Materials

Authors :
John P. Bradley
Jim Ciston
Kenta K. Ohtaki
Hope A. Ishii
Karen C. Bustillo
Source :
Microscopy and Microanalysis. 26:3208-3210
Publication Year :
2020
Publisher :
Oxford University Press (OUP), 2020.

Details

ISSN :
14358115 and 14319276
Volume :
26
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........a9150c3f2ca4e6dede0b2ccea1de06e3
Full Text :
https://doi.org/10.1017/s1431927620024174