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Electron Dose Management for High Angle Annular Dark Field Scanning Transmission Electron Microscope Tomography of Beam Sensitive Materials
- Source :
- Microscopy and Microanalysis. 22:1294-1295
- Publication Year :
- 2016
- Publisher :
- Oxford University Press (OUP), 2016.
- Subjects :
- 010302 applied physics
Conventional transmission electron microscope
Materials science
business.industry
Scanning confocal electron microscopy
02 engineering and technology
021001 nanoscience & nanotechnology
01 natural sciences
Dark field microscopy
law.invention
Optics
Annular dark-field imaging
Electron tomography
law
0103 physical sciences
Scanning transmission electron microscopy
Electron microscope
Electron beam-induced deposition
0210 nano-technology
business
Instrumentation
Subjects
Details
- ISSN :
- 14358115 and 14319276
- Volume :
- 22
- Database :
- OpenAIRE
- Journal :
- Microscopy and Microanalysis
- Accession number :
- edsair.doi...........a8792c7d7d4d11d346873bceb60d4943
- Full Text :
- https://doi.org/10.1017/s1431927616007315