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Direct observation of interface effects of thin AlAs(100) layers buried in GaAs
- Source :
- Applied Surface Science. 166:309-312
- Publication Year :
- 2000
- Publisher :
- Elsevier BV, 2000.
-
Abstract
- A study of the electronic structure of ultrathin AlAs layers buried in GaAs(100) and their interfaces is presented. Al L-2,L-3 soft-X-ray-emission (SXE) spectra from the AlAs layers were measured. ...
- Subjects :
- Interface (Java)
business.industry
Chemistry
Semiconductor materials
Direct observation
General Physics and Astronomy
Synchrotron radiation
Particle accelerator
Surfaces and Interfaces
General Chemistry
Electronic structure
Condensed Matter Physics
Spectral line
Surfaces, Coatings and Films
law.invention
law
Optoelectronics
Atomic physics
business
Subjects
Details
- ISSN :
- 01694332
- Volume :
- 166
- Database :
- OpenAIRE
- Journal :
- Applied Surface Science
- Accession number :
- edsair.doi...........a865d19ca4b2fc0aa537e72a71dc3247
- Full Text :
- https://doi.org/10.1016/s0169-4332(00)00468-2