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Hybrid Gate Dielectric of MoS 2 Transistors for Enhanced Photo‐Electronic Stability

Authors :
Yang-Kyu Choi
Woonggi Hong
Gwang Hyuk Shin
Dong Sik Oh
Geon-Beom Lee
Hamin Park
Sung-Yool Choi
Juyeon Kang
Sung Gap Im
Source :
Advanced Materials Interfaces. 8:2100599
Publication Year :
2021
Publisher :
Wiley, 2021.

Details

ISSN :
21967350
Volume :
8
Database :
OpenAIRE
Journal :
Advanced Materials Interfaces
Accession number :
edsair.doi...........a80a5940aa44686c65dc986c243e55b2
Full Text :
https://doi.org/10.1002/admi.202100599