Automatic ICEMI time-domain muti-point measurement platform

Most of the IC-electromagnetic interference researches get information in the frequency domain. However, in the electromagnetic interference (EMI) leakage research field, the measurement of the time domain is crucial. We have already proposed a single point time-domain EMI signal for information leakage analysis, but a single point measurement is incompetent. This paper proposes an automated measurement platform that can measure, visualize, and plot a time-domain two-dimensional (muti-point) EMI data on Microchip dsPIC33EP512MC202. This proposed automation process can be conveniently extended and applied to a variety of different devices under test.