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4D and In Situ X-ray Microscopy for Studying Damage Evolution in Materials Across Multiple Length Scales

Authors :
Hrishikesh Bale
Steve Kelly
Will Harris
Benjamin Hornberger
Source :
Microscopy and Microanalysis. 24:1010-1011
Publication Year :
2018
Publisher :
Oxford University Press (OUP), 2018.

Details

ISSN :
14358115 and 14319276
Volume :
24
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........a751136c41e9ffb0836194fa09583995
Full Text :
https://doi.org/10.1017/s1431927618005548