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Interferometry by Coherent Convergent-Beam Electron Diffraction

Authors :
Kenji Tsuda
Michiyoshi Tanaka
Source :
Journal of Electron Microscopy. 45:59-63
Publication Year :
1996
Publisher :
Oxford University Press (OUP), 1996.

Subjects

Subjects :
Interferometry
Materials science
Reflection high-energy electron diffraction
Optics
Electron diffraction
Gas electron diffraction
business.industry
Convergent beam
business
Instrumentation
Coherent diffraction imaging
Stacking fault

Details

ISSN :
14779986 and 00220744
Volume :
45
Database :
OpenAIRE
Journal :
Journal of Electron Microscopy
Accession number :
edsair.doi...........a6aa784c47f80c318cb21a9f3c8b36b7
Full Text :
https://doi.org/10.1093/oxfordjournals.jmicro.a023413
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