Microwave dielectric properties of Ca1.15Sm0.85Al0.85Ti0.15O4 ceramics prepared by reaction sintering

In the present work, a high quality (Q) Ca1.15Sm0.85Al0.85Ti0.15O4 (CSAT) ceramic was prepared via reaction sintering (RS) method. The phase structure, surface morphology, packing fraction (PF), and valence bond of the ceramic were systematically investigated. By studying the X-ray diffraction (XRD) pattern of the ceramic, it was determined to exhibit a single-phase tetragonal structure with the dimensions of a = b = 3.6943(13)A and c = 12.0320(23)A and volume of V = 164.22(10) A3. The influence of the intrinsic quality loss factor on the Q × f value was investigated by calculating the PF. Simultaneously, the bond valence of the samarium (Sm) sites was evaluated to elucidate the relationship with the temperature coefficient of resonant frequency (τf). The CSAT ceramic was sintered at 1550 °C for 6 h and exhibited exceptional characteristics in terms of the relative dielectric constant (er) = 17.5, quality factor (Q × f) = 66700 GHz, and τf = −6.93 ppm/°C. These results highlighted the excellent suitability of the RS method for preparing CSAT ceramics with outstanding microwave dielectric properties.