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Electrical and optical characterization of thermally deposited indium-tin-oxide film on high efficiency single-junction GaAs solar cell
- Source :
- 2017 International Conference on Applied System Innovation (ICASI).
- Publication Year :
- 2017
- Publisher :
- IEEE, 2017.
-
Abstract
- The thermally deposited indium-tin-oxide (ITO) film on single-junction GaAs solar-cell as an excellent antireflection, passivation and window layer to achieve higher efficiency is demonstrated. The passivated characteristic of the ITO-film on GaAs solar-cell is examined by saturation-current and ideality factor. The antireflection of the ITO-film on GaAs solar-cell is revealed by optical-reflectance and external quantum-efficiency. The efficiency of 23.52% for the GaAs cell with ITO antireflection-coating (ARC) was higher than that of 21.92% for the GaAs cell with SiO 2 ARC.
- Subjects :
- 010302 applied physics
Materials science
Passivation
business.industry
02 engineering and technology
021001 nanoscience & nanotechnology
01 natural sciences
law.invention
Optical reflection
Indium tin oxide
Gallium arsenide
Characterization (materials science)
chemistry.chemical_compound
chemistry
law
0103 physical sciences
Solar cell
Optoelectronics
0210 nano-technology
business
Layer (electronics)
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 2017 International Conference on Applied System Innovation (ICASI)
- Accession number :
- edsair.doi...........a3f0a05474fb0f363c6530c77e361af9
- Full Text :
- https://doi.org/10.1109/icasi.2017.7988294