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Machine Learning-Based Test Pattern Generation for Neuromorphic Chips

Authors :
Hsiao-Yin Tseng
I-Wei Chiu
Mu-Ting Wu
James Chien-Mo Li
Source :
2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD).
Publication Year :
2021
Publisher :
IEEE, 2021.

Details

Database :
OpenAIRE
Journal :
2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD)
Accession number :
edsair.doi...........a37dc6ff75112fcd38f3077dfc9bfb34

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