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Metrics evaluation of software reliability growth models

Authors :
F.C.L. Chan
R.E. Seviora
P.P. Dasiewicz
Source :
ISSRE
Publication Year :
2002
Publisher :
IEEE Comput. Soc. Press, 2002.

Abstract

Numerous software reliability growth models have been proposed. The authors present three metrics which have been helpful in assessing the applicability and predictive validity of these models. These metrics are the relative fitting error metric, the short term predictive validity metric and the long term predictive validity metric. The application of these three metrics is illustrated on estimation of field reliability of telecommunication switching systems. >

Details

Database :
OpenAIRE
Journal :
Proceedings. 1991 International Symposium on Software Reliability Engineering
Accession number :
edsair.doi...........a36ac8e5978344ad7ca0ce46a62fef1d
Full Text :
https://doi.org/10.1109/issre.1991.145373