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Total Ionizing Dose Response of Commercial 22nm FD-SOI CMOS Technology

Authors :
Jose Solano
Matthew Spear
Trace Wallace
Donald Wilson
Oliver Forman
Ivan Sanchez Esqueda
Hugh Barnaby
Aymeric Privat
Marek Turowski
Rudolf Vonniederhausern
Source :
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC).
Publication Year :
2022
Publisher :
IEEE, 2022.

Details

Database :
OpenAIRE
Journal :
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)
Accession number :
edsair.doi...........a267dec7ab6abcb7b739dc903a9f8e0d

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