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Applications for Machine Learning in Semiconductor Manufacturing and Test (Invited Paper)
- Source :
- 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
- Publication Year :
- 2021
- Publisher :
- IEEE, 2021.
-
Abstract
- In this invited paper, applications for Machine Learning (ML) in several areas of semiconductor manufacturing and test are reviewed and potential opportunities are discussed.
- Subjects :
- 010302 applied physics
Computer science
Semiconductor device fabrication
business.industry
02 engineering and technology
Machine learning
computer.software_genre
01 natural sciences
020202 computer hardware & architecture
Test (assessment)
0103 physical sciences
0202 electrical engineering, electronic engineering, information engineering
Artificial intelligence
business
computer
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
- Accession number :
- edsair.doi...........a21d26d3a471b74a920027db8bff1bf0