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Precession electron diffraction & automated crystallite orientation/phase mapping in a transmission electron microscope
- Source :
- 2011 11th IEEE International Conference on Nanotechnology.
- Publication Year :
- 2011
- Publisher :
- IEEE, 2011.
-
Abstract
- The basics of precession electron diffraction (PED) in a transmission electron microscope (TEM) are briefly discussed. An automated system for the mapping of nanocrystal phases and orientations in a TEM is briefly described. This system is primarily based on the projected reciprocal lattice geometry as extracted from experimental precession electron diffraction spot patterns. Comprehensive open-access crystallographic databases may be used in support of the automated crystallite phase identification process and are, therefore, also briefly mentioned.
- Subjects :
- Diffraction
Reflection high-energy electron diffraction
Materials science
business.industry
Physics::Optics
Condensed Matter::Materials Science
Reciprocal lattice
Optics
Precession electron diffraction
Crystallite
Selected area diffraction
High-resolution transmission electron microscopy
business
Electron backscatter diffraction
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 2011 11th IEEE International Conference on Nanotechnology
- Accession number :
- edsair.doi...........a0ba2ccfc7c7a857185854af24ccdabc