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Erratum to 'advanced thin film technology for ultrahigh resolution X-ray microscopy' [Ultramicroscopy 109 (2009) 1360–1364]
- Source :
- Ultramicroscopy. 110:176
- Publication Year :
- 2010
- Publisher :
- Elsevier BV, 2010.
Details
- ISSN :
- 03043991
- Volume :
- 110
- Database :
- OpenAIRE
- Journal :
- Ultramicroscopy
- Accession number :
- edsair.doi...........a0ae8ae838b53135d58a9dbfc5d2d7b6
- Full Text :
- https://doi.org/10.1016/j.ultramic.2009.11.012