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Dielectric Isolation Using Porous Silicon

Authors :
R. C. Frye
Helmut Baumgart
Fritz Phillipp
Harry J. Leamy
Source :
MRS Proceedings. 33
Publication Year :
1984
Publisher :
Springer Science and Business Media LLC, 1984.

Abstract

The fabrication of silicon-on-insulator structures was examined utilizing epitaxial growth of Si films on porous silicon and subsequent enhanced oxidation of the porous substrate. Porous silicon films have been formed by local anodic dissolution of silicon wafers in HF, while retaining the single crystalline structure. Low temperature liquid phase epitaxy (LPE) from saturated Ga solutions as well as molecular beam epitaxy (MBE) and laser induced epitaxy have been studied. Transmission electron microscopy (TEM) has demonstrated that all three techniques can achieve crystalline Si film growth on porous silicon. Surface smoothness and crystal perfection of the resulting epitaxial layers varies considerably with each technique.

Details

ISSN :
19464274 and 02729172
Volume :
33
Database :
OpenAIRE
Journal :
MRS Proceedings
Accession number :
edsair.doi...........a08598c6cd6dbeb47132bd28bbf3d122
Full Text :
https://doi.org/10.1557/proc-33-63