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Correlation between proton and heavy-ion SEUs in commercial memory devices
- Source :
- 2003 IEEE Radiation Effects Data Workshop.
- Publication Year :
- 2004
- Publisher :
- IEEE, 2004.
-
Abstract
- Proton and heavy-ion SEU testing are performed on commercial 4 M bit-SRAMs and 64M bit-DRAMs. Correlation between proton and heavy-ion SEUs is examined and an empirical equation has been derived between proton SEU cross-section and heavy-ion threshold-LET.
Details
- Database :
- OpenAIRE
- Journal :
- 2003 IEEE Radiation Effects Data Workshop
- Accession number :
- edsair.doi...........a07dc1beb71a2130466914aa79cb27cf
- Full Text :
- https://doi.org/10.1109/redw.2003.1281363