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Application of X-Ray Computerized Tomography to Characterize Particle Retention Within Depth Filters

Authors :
Antonio Celso Fonseca de Arruda
Célio Maschio
Source :
Particle & Particle Systems Characterization. 17:28-32
Publication Year :
2000
Publisher :
Wiley, 2000.

Subjects

Subjects :
Materials science
Optics
business.industry
Depth filter
Particle
X Ray Computerized Tomography
General Materials Science
General Chemistry
Condensed Matter Physics
business

Details

ISSN :
15214117 and 09340866
Volume :
17
Database :
OpenAIRE
Journal :
Particle & Particle Systems Characterization
Accession number :
edsair.doi...........9fea46702cfee36142556b8058c04013

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