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Implementation of Atomic Resolution Electron Tomography of a Needle Sample

Authors :
Wolfgang Theis
Peter Ercius
Colin Ophus
Jianwei Miao
Chien-Chun Chen
Li Wu
M.C. Scott
Rui Xu
Source :
Microscopy and Microanalysis. 21:1523-1524
Publication Year :
2015
Publisher :
Oxford University Press (OUP), 2015.

Subjects

Subjects :
Materials science
Optics
Electron tomography
business.industry
Atomic resolution
business
Instrumentation
Sample (graphics)

Details

ISSN :
14358115 and 14319276
Volume :
21
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........9fe1109256df7d5b5a6921764efa97ad
Full Text :
https://doi.org/10.1017/s1431927615008399
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