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Optimization-Based Artifact Correction for Electron Microscopy Image Stacks

Authors :
Samaneh Azadi
Pieter Abbeel
Jeremy Maitin-Shepard
Source :
Computer Vision – ECCV 2014 ISBN: 9783319106045, ECCV (2)
Publication Year :
2014
Publisher :
Springer International Publishing, 2014.

Abstract

Investigations of biological ultrastructure, such as comprehensive mapping of connections within a nervous system, increasingly rely on large, high-resolution electron microscopy (EM) image volumes. However, discontinuities between the registered section images from which these volumes are assembled, due to variations in imaging conditions and section thickness, among other artifacts, impede truly 3-D analysis of these volumes. We propose an optimization procedure, called EMISAC (EM Image Stack Artifact Correction), to correct these discontinuities. EMISAC optimizes the parameters of spatially varying linear transformations of the data in order to minimize the squared norm of the gradient along the section axis, subject to detail-preserving regularization.

Details

ISBN :
978-3-319-10604-5
ISBNs :
9783319106045
Database :
OpenAIRE
Journal :
Computer Vision – ECCV 2014 ISBN: 9783319106045, ECCV (2)
Accession number :
edsair.doi...........9fb6a53d5b163ae25359a1a28e837027
Full Text :
https://doi.org/10.1007/978-3-319-10605-2_15