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Non-destructive nanoparticle characterisation using a minimum electron dose in quantitative ADF STEM: how low can one go?
- Publication Year :
- 2016
- Publisher :
- Wiley-VCH Verlag GmbH & Co. KGaA, 2016.
Details
- Database :
- OpenAIRE
- Accession number :
- edsair.doi...........9f904004381d0193353b6f3126d4609d
- Full Text :
- https://doi.org/10.1002/9783527808465.emc2016.6196