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Study Of Oscillation In High Voltage Diode At Recovery Operation

Authors :
Katsumi Satoh
Noritoshi Hirano
Akira Kawakami
Hideo Iwamoto
Source :
IEEJ Transactions on Industry Applications. 119:1401-1408
Publication Year :
1999
Publisher :
Institute of Electrical Engineers of Japan (IEE Japan), 1999.

Abstract

At present, switching devices such as GCT (Gate Commutated Turn-off) thyristor and HVIGBT (High Voltage IGBT) are remarkably progressing and able to switch fast at high DC operation voltage above 2.5kV. However, a freewheeling diode which should realize the recovery performance similar to the turn-on performance of switching devices is not developed. In the high voltage diode, a main problem of the recovery performance is to prevent the voltage-oscillation. The voltage-oscillation brings miss-operation of driving circuit or voltage destruction of oneself. As the diode during the recovery operation can be regarded as a combination of one capacitance and two resistances, the oscillation mechanism was studied by replacing the diode to LCR circuit. As this results, it was clear that the diode during the recovery operation made surely the oscillation. On the basis of this analysis, the diode structure to mitigate oscillation was proposed.

Details

ISSN :
13488163 and 09136339
Volume :
119
Database :
OpenAIRE
Journal :
IEEJ Transactions on Industry Applications
Accession number :
edsair.doi...........9f765af8876f440a19863380f6be04eb
Full Text :
https://doi.org/10.1541/ieejias.119.1401