Single Electron Fault in QCA Binary Wire

Authors :: Mohammad Amin Amiri
Mojdeh Mahdavi
Sattar Mirzakuchaki
Source :: 2009 Second International Conference on Advances in Circuits, Electronics and Micro-electronics.
Publication Year :: 2009
Publisher :: IEEE, 2009.
Abstract: Quantum Cellular Automata (QCA) represents an emerging technology at the nanotechnology level. There are various faults which may occur in QCA cells. One of these faults is the Single Electron Fault (SEF) that can happen during manufacturing or operation of QCA circuits. A detailed simulation based logic level modeling of Single Electron Fault for QCA binary wire is represented in this paper.

Subjects :: Physics
Quantum dot
Logic gate
Hardware_INTEGRATEDCIRCUITS
Electronic engineering
Binary number
Hardware_PERFORMANCEANDRELIABILITY
Logic level
Fault (power engineering)
Cellular automaton
Hardware_LOGICDESIGN
Electronic circuit
Quantum cellular automaton

Database :: OpenAIRE
Journal :: 2009 Second International Conference on Advances in Circuits, Electronics and Micro-electronics
Accession number :: edsair.doi...........9f57f2a53201b9d5c8f1cb462e3e98b8
Full Text :: https://doi.org/10.1109/cenics.2009.19