Alpha particle induced single-event error rates and scaling trends in commercial SRAM cells

Authors :: Rick Wong
S.-J. Wen
Indranil Chatterjee
Bharat L. Bhuva
Source :: 2011 12th European Conference on Radiation and Its Effects on Components and Systems.
Publication Year :: 2011
Publisher :: IEEE, 2011.
Abstract: Alpha particles are a critical reliability problem facing advanced technologies. This paper reports extensive tests over a wide range of technology nodes on CMOS SRAMs to study operating voltage, data pattern, operating frequency and operational-mode dependency of alpha particle induced single-event upsets rates.

Subjects :: Range (particle radiation)
Engineering
Reliability (semiconductor)
Soft error
CMOS
business.industry
Electronic engineering
System on a chip
Hardware_PERFORMANCEANDRELIABILITY
Alpha particle
Static random-access memory
business
Scaling

Database :: OpenAIRE
Journal :: 2011 12th European Conference on Radiation and Its Effects on Components and Systems
Accession number :: edsair.doi...........9ec1aca50442d4aea103bfe363918896
Full Text :: https://doi.org/10.1109/radecs.2011.6131400

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