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A 6.4Gb/s/pin at sub-1V supply voltage TX-interleaving technique for mobile DRAM interface

Authors :
Yong-Cheol Bae
Min-Su Ahn
Seong-Jin Jang
Joon-Young Park
Yoon-Joo Eom
Seokhong Kwon
Sang-Hyuk Yoon
Won Young Lee
Gyo-Young Jin
Seung-Jun Bae
Ki-Ho Kim
Baekkyu Choi
Jung-Hwan Choi
Daesik Moon
Jongmin Kim
Chang-Kyo Lee
Source :
VLSIC
Publication Year :
2015
Publisher :
IEEE, 2015.

Abstract

A 6.4Gb/s TX-interleaving (TI) technique at sub-1V supply voltage is implemented with 25nm DRAM process for the future mobile DRAM interface which requires 51.2 GBps (2X Bandwidth of LPDDR4). A newly proposed 2-channel TX interleaving technique with a bootstrapping switch can save power consumption drastically by eliminating repeaters, while operating at 6.4 Gb/s with 40 % enhancement of I/O power efficiency compared to that of the LPDDR4.

Details

Database :
OpenAIRE
Journal :
2015 Symposium on VLSI Circuits (VLSI Circuits)
Accession number :
edsair.doi...........9e2a47c6756f69c61761b693f4e175cb