Understanding Domain Structures in BiFeO3 Thin Films by Combining Phase-Field Simulations, TEM, and PFM

Authors :: Chad M. Folkman
Guang Sheng
Y. L. Li
Darrell G. Schlom
Long Qing Chen
Ramamoorthy Ramesh
Ping P. Wu
R. J. Zeches
B. Winchester
MP Chu
Ho Won Jang
Chang-Beom Eom
Sergei V. Kalinin
Xiaoqing Pan
C. T. Nelson
J. X. Zhang
Source :: Microscopy and Microanalysis. 16:318-319
Publication Year :: 2010
Publisher :: Oxford University Press (OUP), 2010.
Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Subjects :: Materials science
Condensed matter physics
Field (physics)
Phase (matter)
Thin film
Instrumentation
Domain (software engineering)

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