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Anomalous diffraction effect on the surface core-level photoemission from Si(001)2 × 1-Cs surface
- Source :
- Journal of Electron Spectroscopy and Related Phenomena. :539-543
- Publication Year :
- 1998
- Publisher :
- Elsevier BV, 1998.
-
Abstract
- The angular dependence of the Si 2p photoelectron intensity has been measured for a Cs-saturated Si(001)2 x 1 surface. A surface Si 2p component, which is attributed to the Si-dimer underneath the ...
- Subjects :
- Double layer (biology)
Surface (mathematics)
Radiation
Chemistry
Anomalous diffraction
Inverse photoemission spectroscopy
Analytical chemistry
Angle-resolved photoemission spectroscopy
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials
Intensity (physics)
Adsorption
Physical and Theoretical Chemistry
Atomic physics
Spectroscopy
Subjects
Details
- ISSN :
- 03682048
- Database :
- OpenAIRE
- Journal :
- Journal of Electron Spectroscopy and Related Phenomena
- Accession number :
- edsair.doi...........9da7f99281067770332947bf55612bb7
- Full Text :
- https://doi.org/10.1016/s0368-2048(97)00159-x