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Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance

Authors :
Sebastien Fregonese
Chhandak Mukherjee
Holger Rucker
Pascal Chevalier
Gerhard Fischer
Didier Celi
Marina Deng
Marine Couret
Francois Marc
Cristell Maneux
Thomas Zimmer
Source :
2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS).
Publication Year :
2021
Publisher :
IEEE, 2021.

Details

Database :
OpenAIRE
Journal :
2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)
Accession number :
edsair.doi...........9d7b28b5757ba10ce9bec781a0089fc7

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