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A Sequential Tunneling Model for Calculating Gate Leakage Current of Nanometer Metal-Oxide-Semiconductor Transistor
- Source :
- Journal of Nanoelectronics and Optoelectronics. 13:240-244
- Publication Year :
- 2018
- Publisher :
- American Scientific Publishers, 2018.
Details
- ISSN :
- 1555130X
- Volume :
- 13
- Database :
- OpenAIRE
- Journal :
- Journal of Nanoelectronics and Optoelectronics
- Accession number :
- edsair.doi...........9d71b36f62e3bd753cd29660869ec3f1