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A Sequential Tunneling Model for Calculating Gate Leakage Current of Nanometer Metal-Oxide-Semiconductor Transistor

Authors :
Yanbing Xu
Hongguan Yang
Source :
Journal of Nanoelectronics and Optoelectronics. 13:240-244
Publication Year :
2018
Publisher :
American Scientific Publishers, 2018.

Details

ISSN :
1555130X
Volume :
13
Database :
OpenAIRE
Journal :
Journal of Nanoelectronics and Optoelectronics
Accession number :
edsair.doi...........9d71b36f62e3bd753cd29660869ec3f1