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Reliable Sub-Nanosecond Switching in Magnetic Tunnel Junctions for MRAM Applications
- Source :
- IEEE Transactions on Electron Devices. 69:7180-7183
- Publication Year :
- 2022
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2022.
- Subjects :
- Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Subjects
Details
- ISSN :
- 15579646 and 00189383
- Volume :
- 69
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Electron Devices
- Accession number :
- edsair.doi...........9cf50b590f58f5adbd8a994a441d7886
- Full Text :
- https://doi.org/10.1109/ted.2022.3214168