High Resolution Thermal Wave Measurements and Imaging of Defects and Damage in Electronic Materials

Authors :: J. Opsal
Source :: Photoacoustic and Photothermal Phenomena II ISBN: 9783662137956
Publication Year :: 1990
Publisher :: Springer Berlin Heidelberg, 1990.
Abstract: Thermal wave measurements and images are presented that illustrate the sensitivity to damage and defect resolution attainable in a laser-based thermal wave system.

Subjects :: Optics
Nuclear magnetic resonance
Materials science
business.industry
law
Resolution (electron density)
High resolution
Sensitivity (control systems)
Thermal wave
business
Laser
Electronic materials
law.invention

Tools