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Ion-beam exposure on PAM surface according to molecular concentration for application to liquid-crystal device

Authors :
Dong Wook Lee
Dong Hyun Kim
Jin Young Oh
Jonghoon Won
Da Bin Yang
Hae-Chang Jeong
Dae-Shik Seo
Source :
Journal of Materials Science: Materials in Electronics. 34
Publication Year :
2023
Publisher :
Springer Science and Business Media LLC, 2023.

Details

ISSN :
1573482X and 09574522
Volume :
34
Database :
OpenAIRE
Journal :
Journal of Materials Science: Materials in Electronics
Accession number :
edsair.doi...........9b7309544d1e1d5a97900fcc824f8396
Full Text :
https://doi.org/10.1007/s10854-023-10523-6