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Impact of nanomaterial arrangement on the reliability and the electron mobility in AlGaN/GaN HEMTs

Authors :
V. N. Petrov
S. I. Vidyakin
G A Oganesyan
E. I. Shabunina
A V Sakharov
Ya. M. Parnes
A. G. Gudkov
A. A. Zybin
Source :
Journal of Physics: Conference Series. 741:012172
Publication Year :
2016
Publisher :
IOP Publishing, 2016.

Abstract

The obtained results demonstrate that the improvement of nanomaterial arrangement in AlGaN/GaN HEMT structures quantitatively characterized with the use of a multifractal parameter (the degree of disorder) results in the increase at several times in the electron mobility values at 2DEG channel in HEMT structures and the reliability of HEMT parameters.

Details

ISSN :
17426596 and 17426588
Volume :
741
Database :
OpenAIRE
Journal :
Journal of Physics: Conference Series
Accession number :
edsair.doi...........9ae8798054593c2551f8cdc3b133cc8a