Strong reduction of thermally activated flux jump rate in superconducting thin films by nanodot-induced pinning centers

From frequency-dependent ac susceptibility studies of (Cu,T1)BaSrCa2Cu3Oy superconducting thin films, with and without nanodot-induced artificial pinning centers, we estimated the activation energy of flux jumps. The result was that, in the film with nanodots, the pinning potential is several times higher, leading to a probability of thermally activated flux jumps several orders of magnitude lower than in the film without artificial pinning centers. We suggest that our no cost straightforward method for creating extended defects can be successfully employed for the reduction of thermal noise in superconducting electronic devices.