Absence of size dependence in the spin-glass resistivity of AuFe wires?

We report on the low-temperature resistivity ρ(T) of AuFe spin-glass wires with a thickness around 20 nm and a linewidth varying between 300 μm and 150 nm. The observed linewidth dependence of ρ(T) is due to the contribution of the disorder-enhanced electron-electron interaction, while the spin-glass contribution is independent of linewidth. However, a quantitative analysis of the ρ(T) data reveals a substantial suppression of both the amplitude of the spin-glass resistivity and the interaction strength between magnetic impurities when compared to bulk AuFe alloys. This may indicate the presence of a size effect resulting from the finite spin-glass thickness.