Measurements of the optical properties of liquid silicon and germanium using nanosecond time‐resolved ellipsometry

The optical properties of liquid silicon and germanium have been determined at several laser wavelengths from 1.96 to 3.71 eV, using time‐resolved ellipsometric measurements during pulsed laser melting. The results from these transient melting experiments are compared with results from the literature for materials held above their melting temperatures for long periods of time. The results for liquid germanium agree well with those of J. N. Hodgson [Philos. Mag. 6, 509 (1961)], but the results for liquid silicon disagree with the results of K. M. Shvarev, B. A. Baum, and P. V. Gel’d [High Temp. 15, 548 (1977)].