Towards Multi-View Test Specification in CPPS Engineering

Authors :: Dietmar Winkler
Serafima Sherstneva
Stefan Biffl
Source :: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA).
Publication Year :: 2022
Publisher :: IEEE, 2022.

Database :: OpenAIRE
Journal :: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)
Accession number :: edsair.doi...........9953da36b13603f8d03b9be39f55cd9e
Full Text :: https://doi.org/10.1109/etfa52439.2022.9921658