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High-resolution PIXE instrumentation survey. Part II
- Source :
- Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 150:103-108
- Publication Year :
- 1999
- Publisher :
- Elsevier BV, 1999.
-
Abstract
- High resolution PIXE facilities (X-ray crystal spectrometers working on ion beams of accelerators) and their applications in chemical analysis and in basic research are surveyed.
Details
- ISSN :
- 0168583X
- Volume :
- 150
- Database :
- OpenAIRE
- Journal :
- Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Accession number :
- edsair.doi...........9864482aeee5a1f1de7ed5507b6ba81d
- Full Text :
- https://doi.org/10.1016/s0168-583x(98)01081-7