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High-energy X-ray diffuse scattering

Authors :
Harald Reichert
Veijo Honkimäki
I. B. Ramsteiner
A. Schöps
Helmut Dosch
Jerome B. Hastings
Z. Zhong
Source :
Journal of Applied Crystallography. 42:392-400
Publication Year :
2009
Publisher :
International Union of Crystallography (IUCr), 2009.

Abstract

Diffuse X-ray scattering has been an important tool for understanding the atomic structure of binary systems for more than 50 years. The majority of studies have used laboratory-based sources providing 8 keV photons or synchrotron radiation with similar energies. Diffuse scattering is weak, with the scattering volume determined by the X-ray absorption length. In the case of 8 keV photons, this is not significantly different from the typical extinction length for Bragg scattering. If, however, one goes to energies of the order of 100 keV the scattering volume for the diffuse scattering increases up to three orders of magnitude while the extinction length increases by only one order of magnitude. This leads to a gain of two orders of magnitude in the relative intensity of the diffuse scattering compared with the Bragg peaks. This gain, combined with the possibility of recording the intensity from an entire plane in reciprocal space using a two-dimensional X-ray detector, permits time-resolved diffuse scattering studies in many systems. On the other hand, diffraction features that are usually neglected, such as multiple scattering, come into play. Four types of multiple scattering phenomena are discussed, and the manner in which they appear in high-energy diffraction experiments is considered.

Details

ISSN :
00218898
Volume :
42
Database :
OpenAIRE
Journal :
Journal of Applied Crystallography
Accession number :
edsair.doi...........97a928bc5b39a89cbd2ba6c3c3e90bcb
Full Text :
https://doi.org/10.1107/s0021889809011492