Cite
Charge Carrier Dynamics for Silicon Oxide Tunneling Junctions Mediated by Local Pinholes
MLA
Jiang Sheng, et al. “Charge Carrier Dynamics for Silicon Oxide Tunneling Junctions Mediated by Local Pinholes.” SSRN Electronic Journal, Jan. 2021. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........97a80917e3df69ad954602e5f3664df5&authtype=sso&custid=ns315887.
APA
Jiang Sheng, Xi Yang, Zunke Liu, Yunxing Zhao, Linna Lu, Zhenhai Yang, Jichun Ye, Yuheng Zeng, Baojie Yan, James C. Greer, Mei Cui, Li Chen, Wei Guo, & Weichuang Yang. (2021). Charge Carrier Dynamics for Silicon Oxide Tunneling Junctions Mediated by Local Pinholes. SSRN Electronic Journal.
Chicago
Jiang Sheng, Xi Yang, Zunke Liu, Yunxing Zhao, Linna Lu, Zhenhai Yang, Jichun Ye, et al. 2021. “Charge Carrier Dynamics for Silicon Oxide Tunneling Junctions Mediated by Local Pinholes.” SSRN Electronic Journal, January. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........97a80917e3df69ad954602e5f3664df5&authtype=sso&custid=ns315887.