Experimental determination of the inelastic mean free path (IMFP) of electrons in Cr, Mo, Ge and Si based on the elastic peak intensity ratio with a Ni reference sample

MLA

M. Menyhard, et al. “Experimental Determination of the Inelastic Mean Free Path (IMFP) of Electrons in Cr, Mo, Ge and Si Based on the Elastic Peak Intensity Ratio with a Ni Reference Sample.” Surface Science, July 1995, pp. 1203–07. EBSCOhost, https://doi.org/10.1016/0039-6028(95)00070-4.

APA

M. Menyhard, Attila Sulyok, G. Gergely, Cs.S. Daróczi, K. Péntek, Beata Lesiak, & Aleksander Jablonski. (1995). Experimental determination of the inelastic mean free path (IMFP) of electrons in Cr, Mo, Ge and Si based on the elastic peak intensity ratio with a Ni reference sample. Surface Science, 1203–1207. https://doi.org/10.1016/0039-6028(95)00070-4

Chicago

M. Menyhard, Attila Sulyok, G. Gergely, Cs.S. Daróczi, K. Péntek, Beata Lesiak, and Aleksander Jablonski. 1995. “Experimental Determination of the Inelastic Mean Free Path (IMFP) of Electrons in Cr, Mo, Ge and Si Based on the Elastic Peak Intensity Ratio with a Ni Reference Sample.” Surface Science, July, 1203–7. doi:10.1016/0039-6028(95)00070-4.