Crystal Structure Analyses of Organic Semiconductor Thin Films with Variable-Temperature Two-Dimensional Grazing Incidence X-ray Diffraction

Authors :: R. Abe
H. Kojima
M. Kikuchi
T. Watanabe
T. Koganezawa
N. Yoshimoto
I. Hirosawa
M. Nakamura
Source :: Extended Abstracts of the 2017 International Conference on Solid State Devices and Materials.
Publication Year :: 2017
Publisher :: The Japan Society of Applied Physics, 2017.

Subjects :: Organic semiconductor
Crystallography
Materials science
X-ray crystallography
Crystal structure
Thin film
Incidence (geometry)

Database :: OpenAIRE
Journal :: Extended Abstracts of the 2017 International Conference on Solid State Devices and Materials
Accession number :: edsair.doi...........9756b60e5f633b899be33b0fb240b4c1

Tools